Skip to main content

Substrate RF Losses and Non-linearities in GaN on Si HEMT Technology

Sachin Yadav, Pieter Cardinael, Ming Zhao, Komal Vondkar, Ahmad Khaled, Raul Rodriguez, Bjorn Vermeersch, Sergej Makovejev, Enrique Ekoga, Alexandre Pottrain, Niamh Waldron, Jean Pierre Raskin, Bertrand Parvais, Nadine Collaert

DOI
10.17023/ntvv-sf21
  • EDS
    Members: $5.00
    IEEE Members: $10.00
    Non-members: $20.00
    Length: 00:19:55

More Like This

Manufacturing Webinar Series - Exploring Sustainable Alternatives in Semiconductor Manufacturing
13 Nov 2024

Manufacturing Webinar Series - Exploring Sustainable Alternatives in Semiconductor Manufacturing

1.00 pdh
  • EDS
    Members: Free
    IEEE Members: $15.00
    Non-members: $20.00
Game Changing Semiconductor Technologies - From High Power to Miniaturized and Smart LEDs (Video)
22 Oct 2024

Game Changing Semiconductor Technologies - From High Power to Miniaturized and Smart LEDs (Video)

1.00 pdh
  • EDS
    Members: Free
    IEEE Members: $15.00
    Non-members: $20.00
Carbon footprint reduction in Semiconductor fabs (Video)
16 Oct 2024

Carbon footprint reduction in Semiconductor fabs (Video)

1.00 pdh
  • EDS
    Members: Free
    IEEE Members: $15.00
    Non-members: $20.00