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Deep Insights into the Failure Mechanisms in Field Cycled Ferroelectric Hf 0.5 Zr 0.5 O2 Thin Film: TDDB Characterizations and First Principles Calculations
15 Dec 2020

Deep Insights into the Failure Mechanisms in Field Cycled Ferroelectric Hf 0.5 Zr 0.5 O2 Thin Film: TDDB Characterizations and First Principles Calculations

  • EDS
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