Skip to main content
ieee top header menu
IEEE.org
IEEE Xplore Digital Library
IEEE Standards
IEEE Spectrum
More Sites
Anonymous user menu
Cart
Create Account
Sign In
Conferences
EDTM
IEDM
IITC
VLSI
Education
Podcasts
Short Courses
Webinars
Leave this field blank
Search
IEEE EDS Resource Center
franco
Apply
15 Dec 2020
Atomic Hydrogen Exposure to Enable High Quality Low Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
EDS
Members:
$5.00
IEEE Members:
$10.00
Non-members:
$20.00
Subscribe to franco