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souvik mahapatra

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Negative Bias Temperature Instability (NBTI) modeling from devices to circuits
28 Jul 2021

Negative Bias Temperature Instability (NBTI) modeling from devices to circuits

1.00 pdh
  • EDS
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A Model for Hole Trapping-Detrapping Kinetics During NBTI in p-Channel FETs
01 Mar 2020

A Model for Hole Trapping-Detrapping Kinetics During NBTI in p-Channel FETs

  • EDS
    Members: $5.00
    IEEE Members: $10.00
    Non-members: $20.00