traps

Showing 1 - 1 of 1 resources. Too many results? Use the search filters to refine your search.

Sort by

Sub-ns Polarization Switching in 25nm FE FinFET toward Post CPU and Spatial Energetic Mapping of Traps for Enhanced Endurance

15 Dec 2020

Sub-ns Polarization Switching in 25nm FE FinFET toward Post CPU and Spatial Energetic Mapping of Traps for Enhanced Endurance

EDS

Members: $5.00
IEEE Members: $10.00
Non-members: $20.00