Field Induced Acceptor Ionization in Enhancement Mode GaN p-MOSFETs

Nadim Chowdhury, Qingyun Xie, John Niroula, Nitul Rajput, Kai Cheng, Han Wui Then, Tomas Palacios

DOI

10.17023/yqc5-cs27

EDS

Members: $5.00
IEEE Members: $10.00
Non-members: $20.00

Length: 00:20:00

15 Dec 2020

Tags:

nadim chowdhury

acceptor ionization

enhancement mode

More Like This

Manufacturing Webinar Series - Exploring Sustainable Alternatives in Semiconductor Manufacturing

13 Nov 2024

Manufacturing Webinar Series - Exploring Sustainable Alternatives in Semiconductor Manufacturing

1.00 pdh

EDS

Members: Free
IEEE Members: $15.00
Non-members: $20.00

Game Changing Semiconductor Technologies - From High Power to Miniaturized and Smart LEDs (Video)

22 Oct 2024

Game Changing Semiconductor Technologies - From High Power to Miniaturized and Smart LEDs (Video)

1.00 pdh

EDS

Members: Free
IEEE Members: $15.00
Non-members: $20.00

Carbon footprint reduction in Semiconductor fabs (Video)

16 Oct 2024

Carbon footprint reduction in Semiconductor fabs (Video)

1.00 pdh

EDS

Members: Free
IEEE Members: $15.00
Non-members: $20.00