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Field Induced Acceptor Ionization in Enhancement Mode GaN p-MOSFETs
15 Dec 2020

Field Induced Acceptor Ionization in Enhancement Mode GaN p-MOSFETs

  • EDS
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Depolarization Field Induced Instability of Polarization States in HfO2 Based Ferroelectric FET
15 Dec 2020

Depolarization Field Induced Instability of Polarization States in HfO2 Based Ferroelectric FET

  • EDS
    Members: $5.00
    IEEE Members: $10.00
    Non-members: $20.00